® Atline XRF Analyzer Series" data-bg="f:contain;" class="rev-slidebg" data-no-retina> OXEA® Atline VS
Atline X-ray Elemental Analyzer (patented)
OXEA® Atline version as Full Protection Device.
OXEA® Atline series VS has been made to meet the highest regulatory requirements
(German Type Approval # BfS 08/08 V RöV).
When online is not possible or not desired, our OXEA® Atline series delivers the same results for all applications shown down. The atline instrument measures the entire elemental composition – within 2 minutes. Easier and faster to use than laboratory measurement instruments.
■ No need for radiation safety officer.
■ No licensing required (only registration).
■ No sample preparation needed; measures on granulated material.
■ For measuring samples with a volume of ½ l.
Comment: Application same as OXEA® Online.
Analyzer Types
OXEA® - Atline 1000
Measuring Principle:
XRF/backscatter
Measured Parameters:
Ash content – Elements with Z>10
Advantages:
Compensation of elemental ash composition – Best accuracy
Limitation:
Particle size max. < 50 mm, avg.< 25 mm – Distance to surface ~20 mm – Sled or Bypass belt application
OXEA® - Atline 2000
Measuring Principle:
XRF/backscatter
Measured Parameters:
Ash – Sulphur – Elements with Z>10
Advantages:
Compensation of elemental ash composition – Best accuracy
Limitation:
Particle size max. < 50 mm, avg.< 25 mm – Distance to surface ~20 mm – Sled or Bypass belt application
OXEA® - Atline 3000
Measuring Principle:
XRF/backscatter
Measured Parameters:
Ash – Sulphur – Volatiles – Ash fusion – Type recognition – Elements with Z>10
Advantages:
Compensation of elemental ash composition – Best accuracy
Limitation:
Particle size max. < 50 mm, avg.< 25 mm – Distance to surface ~20 mm – Sled or Bypass belt application
